High-Endurance (>1011cycles) and Thermally-Stable Sub-100nm TiO2 Channel FeFET for Low-Power Memory Centric 3D-LSI Applications
Autor: | Taro Shiokawa, Reika Ichihara, Takamasa Hamai, Kiwamu Sakuma, Kota Takahashi, Kazuhiro Matsuo, Masumi Saitoh |
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Rok vydání: | 2023 |
Zdroj: | 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). |
Databáze: | OpenAIRE |
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