Thermostructural changes and instability of the melts based on Ni according to the data of X-ray photoelectron spectroscopy

Autor:	I.N. Shabanova, G.V. Sapozhnikov, A.V. Kholzakov
Rok vydání:	2004
Předmět:	Radiation Chemistry Relaxation (NMR) Analytical chemistry Relaxation process Atmospheric temperature range Condensed Matter Physics Instability Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Liquid state X-ray photoelectron spectroscopy Condensed Matter::Superconductivity Surface layer Physical and Theoretical Chemistry Spectroscopy
Zdroj:	Journal of Electron Spectroscopy and Related Phenomena. :559-564
ISSN:	0368-2048
DOI:	10.1016/j.elspec.2004.02.025
Popis:	Relaxation processes in the melts Ni84P16, Ni81P19 were studied by the X-ray photoelectron spectroscopy over a wide temperature range. The evolution of the surface layer composition in the melt has an non-monotonous oscillatory character.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6bcbbfe7cea29c8247c556ce4467248e https://doi.org/10.1016/j.elspec.2004.02.025 Zobrazit plný text záznamu Full Text from ScienceDirect