Optical characterization of OLED displays
| Autor: | Véronique Collomb-Patton, Thibault Bignon, Pierre Boher, Thierry Leroux |
|---|---|
| Rok vydání: | 2015 |
| Předmět: |
Materials science
Pixel Physics::Instrumentation and Detectors business.industry Transistor Multispectral image Viewing angle Polarization (waves) Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention Optics law OLED Radiance Optoelectronics Electrical and Electronic Engineering business Diode |
| Zdroj: | Journal of the Society for Information Display. 23:429-437 |
| ISSN: | 1071-0922 |
| DOI: | 10.1002/jsid.369 |
| Popis: | Multispectral viewing angle and imaging characterization have been applied to different organic light-emitting diode (OLED) displays. Angular dependence of the OLED emission is always complex because of its multilayer structure. Spectral information is also related to the geometry of Fabry–Perot-like structure of each OLED. High-resolution viewing angle measurements of different OLED displays are reported and compared. Multispectral viewing angle polarization properties are also reported. Imaging measurements allow to detect wavelength shift on the surface of the displays probably related to thickness non-uniformities. Local radiance fluctuations from one pixel to the other more related to driving problems due to the dispersion of the electric properties of the driving thin-film transistors are also detected. |
| Databáze: | OpenAIRE |
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