Model for selecting test methods of detecting fraudulent electronic components
Autor: | S. V. Michurin, Ya A. Shchenikov, V. O. Sidorov |
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Rok vydání: | 2020 |
Předmět: | |
Zdroj: | Journal of Physics: Conference Series. 1515:022059 |
ISSN: | 1742-6596 1742-6588 |
DOI: | 10.1088/1742-6596/1515/2/022059 |
Popis: | The article deals with the issues of electronic components incoming inspection processes risk management. A comparative analysis of the cost of using instruments used to identify fraudulent electronic components is carried out. A model developed using principles similar to FMEA-analysis is presented to select plans for detecting counterfeit and fraudulent electronic components based on the influence of factors such as the size of the batch, the criticality of application, and the source of supply. |
Databáze: | OpenAIRE |
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