Model for selecting test methods of detecting fraudulent electronic components

Autor: S. V. Michurin, Ya A. Shchenikov, V. O. Sidorov
Rok vydání: 2020
Předmět:
Zdroj: Journal of Physics: Conference Series. 1515:022059
ISSN: 1742-6596
1742-6588
DOI: 10.1088/1742-6596/1515/2/022059
Popis: The article deals with the issues of electronic components incoming inspection processes risk management. A comparative analysis of the cost of using instruments used to identify fraudulent electronic components is carried out. A model developed using principles similar to FMEA-analysis is presented to select plans for detecting counterfeit and fraudulent electronic components based on the influence of factors such as the size of the batch, the criticality of application, and the source of supply.
Databáze: OpenAIRE