Debris mitigation in pinhole-apertured point-projection backlit imaging
| Autor: | B. E. Blue, J. F. Hansen, Harry Robey, D. C. Eder, M. T. Tobin |
|---|---|
| Rok vydání: | 2004 |
| Předmět: |
Physics
Physics::Instrumentation and Detectors business.industry Aperture Detector Astrophysics::Instrumentation and Methods for Astrophysics Physics::Optics Substrate (printing) Backlight Laser Physics::History of Physics law.invention Optics law Physics::Accelerator Physics Pinhole (optics) Image sensor business Instrumentation Image resolution |
| Zdroj: | Review of Scientific Instruments. 75:4775-4777 |
| ISSN: | 1089-7623 0034-6748 |
| DOI: | 10.1063/1.1809288 |
| Popis: | Pinhole-apertured point-projection x-ray radiography is an important diagnostic technique for obtaining high resolution, high contrast, and large field-of-view images used to diagnose the hydrodynamic evolution of high energy density experiments. In this technique, a pinhole aperture is placed between a laser irradiated foil (x-ray source) and an imaging detector. In the present geometry, the x rays that are not transmitted through the pinhole aperture, ablate the pinhole substrate’s surface, and turn it into a flyer plate. The pinhole substrate then breaks apart into shrapnel, and that shrapnel can damage diagnostics inside the target chamber. In this letter, we present a technique on mitigating the debris by using a tilted pinhole. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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