Autor:	V. P. Tolstoi, E. V. Tolstobrov
Rok vydání:	2002
Předmět:	Silicon chemistry Ellipsometry General Chemical Engineering Analytical chemistry chemistry.chemical_element Ionic bonding Deposition (phase transition) General Chemistry Spectroscopy Quartz Microanalysis Layer (electronics)
Zdroj:	Russian Journal of Applied Chemistry. 75:1529-1531
ISSN:	1070-4272
DOI:	10.1023/a:1022274206300
Popis:	Conditions for the synthesis of α-PbO2 layers on silica surfaces by successive ionic layer deposition were determined. These layers were studied by X-ray spectral microanalysis, X-ray diffraction, IR Fourier spectroscopy, UV-Vis spectroscopy, and ellipsometry.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6b65cdeeac978e257ee0d819b860dfbc https://doi.org/10.1023/a:1022274206300 Zobrazit plný text záznamu Full text from SpringerLink