A Study Of The Behavior Of Se And Bse In Ultra Low Landing Voltage Condition

Autor: Takeuchi, Shuichi, Miyaki, Atsushi, Muto, Atsushi, Dan, Yukari, Shigeto, Kunji, Nakagawa, Mine, Teranishi, Toshiharu, Majima, Yutaka
Rok vydání: 2009
DOI: 10.3217/978-3-85125-062-6-099
Popis: Mc 2009. Microscopy Conference, Graz, Austria. 30 August - 4 September 2009. First Joint Meeting Of Dreiländertagung And Multinational Congress On Microscopy.
Databáze: OpenAIRE