The analysis of thick target metal alloys

Autor: V. Cindro, M. Budnar, Ž. Šmit, V. Ramšak, M. Ravnikar
Rok vydání: 1984
Předmět:
Zdroj: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 4:114-119
ISSN: 0168-583X
DOI: 10.1016/0168-583x(84)90050-8
Popis: The application of proton induced X-ray emission (PIXE) for elemental analysis of metal alloys was studied. A simple correction function is introduced, which takes into account thick target effects. Calibration standards are thus avoided and the concentrations are obtained from X-ray production cross sections. The method was tested and good agreement was found between the reference and measured concentrations.
Databáze: OpenAIRE