Power spectral density measurement for large aspheric surfaces

Autor:	Fan Wu, Shibin Wu, Wei Chen, Qiang Chen, Hanmin Yao
Rok vydání:	2008
Předmět:	Wavefront Surface (mathematics) Wavefront aberration Materials science business.industry Spectral density Electronic Optical and Magnetic Materials Interferometry Optics Quality (physics) Software Spatial frequency Electrical and Electronic Engineering business
Zdroj:	Frontiers of Optoelectronics in China. 1:197-200
ISSN:	1674-4594 1674-4128
DOI:	10.1007/s12200-008-0032-2
Popis:	To ensure the safe and normal operation of the whole optical system, it is important to test and evaluate the quality of optical components. The article explores the advantages and disadvantages of general parameters used in aspheric surface testing, the composition of the system, the principle of operation and the design of related power spectral density (PSD) software used in testing large aspheric surfaces with Shack-Hartmann and phase shifting interferometer. The results indicate that PSD can give the spatial frequency distribution of the wavefront aberration when large aperture phase shifting interferometer is used as an instrument to test the wavefront, and this can also be applied as an evaluation standard in testing the quality of optical components. In addition, this paper describes the test results of optical components in the size of 64 mm × 64 mm.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6ae3835dcc40dc4b484a8ee5de16f631 https://doi.org/10.1007/s12200-008-0032-2 Zobrazit plný text záznamu Full text from SpringerLink