| Autor: |
Jim Magee, Abhijit Gurav, Reggie Phillips, Scott Carson |
| Rok vydání: |
2016 |
| Předmět: |
|
| Zdroj: |
Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT). 2016:000290-000298 |
| ISSN: |
2380-4491 |
| DOI: |
10.4071/2016-hitec-290 |
| Popis: |
For applications such as electronics for down-hole drilling and exploration, geothermal energy generation and power electronics, there is a growing need for capacitors that have robust reliability at temperatures of 150°C or above. Conventional X7R and X8R type ceramic capacitors are designed for applications up to 125°C and 150°C, respectively. At temperatures above 150°C, these types of capacitors typically suffer from degradation of reliability performance and severe reduction in capacitance, especially under DC bias conditions. A Class-I C0G dielectric has been developed using Nickel electrodes for high temperature application up to 200°C and beyond. Due to its linear dielectric nature, this material exhibits highly stable capacitance as a function of temperature and voltage. Multi-layer ceramic capacitors (MLCC) made from this material can be qualified as X9G with robust reliability. These C0G capacitors are showing robust reliability at extreme temperature of 260°C (500 degrees Fahrenheit). We have also developed a modified-X7R dielectric composition with nickel internal electrodes showing high reliability in this Class-II dielectric at 175°C. This paper will report electrical properties and reliability test data on these Class-I C0G and Class-II ceramic capacitors at high temperatures of 150–200°C and above. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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