Measurment of Young's Modulus and Stress Analysis of Magnetic Thin Films
| Autor: | Yukitaka Murakami, Yukari Komaba, Hidetoshi Yanai, Nobuyuki Kishine |
|---|---|
| Rok vydání: | 1994 |
| Předmět: |
Materials science
business.industry Tension (physics) Mechanical Engineering Young's modulus Structural engineering Substrate (electronics) Tribology equipment and supplies Stress (mechanics) symbols.namesake Mechanics of Materials Shear stress symbols Head (vessel) General Materials Science Composite material Thin film business human activities |
| Zdroj: | TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series A. 60:1108-1113 |
| ISSN: | 1884-8338 0387-5008 |
| DOI: | 10.1299/kikaia.60.1108 |
| Popis: | When a flexible magnetic medium is driven, it is in contact with the magnetic head. To evaluate the tribological behavior of fiexible media, it is necessary to measure the mechanical properties. However, it is very difficult to measure the mechanical properties, since the magnetic layer is very thin and is attached to the substrate. First, this paper proposes a convenient method for separately determining Young's moduli of two thin films of a magnetic medium. Second, the particular stress distribution inside a magnetic film (bonded two thin films) is analyzed. The internal stress in the medium is not uniform when the medium is subjected to tension. The analysis shows that the difference in Poisson's ratio in two bonded thin films causes flexure of the medium under tension as well as shearing stress at the interface between the magnetic layer and the substrate. Since the shearing stress may cause fatigue damage of the tape edge, detailed FEM analysis on its distribution is carried out. |
| Databáze: | OpenAIRE |
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