| Popis: |
In the early days of semiconductor manufacturing, the four-point probe became established as the tool-of-choice for monitoring diffusion processes. The application of the four-point probe to ion implantation in the early 1960s was basically limited to the single-point measurement of dose, since the equipment did not have the necessary precision or repeatability to provide useful uniformity results. As a result, implanter uniformity was determined by either a visual observation of a heavily doped wafer or by a mylar bum. Unfortunately, these techniques were either subject to interpretation by the user or could not provide a parameter that could be statistically tracked or characterized. During the last 30 years, the commercial ion implanter as well as the dose and uniformity characterization equipment used to characterize this production tool have progressed significantly. Indeed, several generations of electrical and optical equipment have been developed to measure both the dose and uniformity of the increasingly advanced and complex ion implanter. This paper will review all of the techniques and equipment used to measure the uniformity of ion implantation. In addition, various graphical techniques developed to present early measurement results will be discussed. |
