A model for the confocal volume of 3D micro X-ray fluorescence spectrometer
| Autor: | Birgit Kanngieβer, Wolfgang Malzer |
|---|---|
| Rok vydání: | 2005 |
| Předmět: |
Spectrometer
Chemistry business.industry Confocal Resolution (electron density) Fluorescence Atomic and Molecular Physics and Optics Analytical Chemistry Characterization (materials science) Optics Volume (thermodynamics) Micro-X-ray fluorescence Sensitivity (control systems) business Instrumentation Spectroscopy |
| Zdroj: | Spectrochimica Acta Part B: Atomic Spectroscopy. 60:1334-1341 |
| ISSN: | 0584-8547 |
| DOI: | 10.1016/j.sab.2005.07.006 |
| Popis: | The newest development in Micro X-Ray Fluorescence Analysis (micro-XRF) is the expansion of its capabilities to depth resolution using a confocal setup with X-ray optics. While the usefulness of this 3D micro-XRF method has already been shown for a number of applications, reliable quantification procedures still have to be developed. In this paper, we present expressions for the primary fluorescence intensity of various types of 3D micro-XRF experiments based on the fundamental parameter approach. A major constituent of these equations is the description of the confocal volume defined by the X-ray optics used. The model provides analytical expressions for the sensitivity of the 3D micro-XRF spectrometer, which is the characteristic quantity. It opens up the way for an experimental characterization of the spectrometer and for a general quantification of 3D micro-XRF measurements. First experimental evidence is presented for the validity of relations derived. Furthermore, distinct features of 3D micro-XRF measurements in comparison to ordinary XRF measurements are discussed. |
| Databáze: | OpenAIRE |
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