The Single Event Upset Forecasting in Digital and Analog Integrated Circuits in SAED 14nm FinFet Technology
| Autor: | V.Sh. Melikyan, Zaven M. Avetisyan, A.Kh. Mkhitaryan, Synopsys Armenia Cjsc, Artur A. Petrosyan, A.E. Mkrtchyan, Artak Hayrapetyan |
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| Rok vydání: | 2018 |
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| Zdroj: | Problems of advanced micro- and nanoelectronic systems development. :76-81 |
| ISSN: | 2078-7707 |
| DOI: | 10.31114/2078-7707-2018-4-76-81 |
| Databáze: | OpenAIRE |
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