Visualization of deuterium flux and grain boundary diffusion in duplex stainless steel and Fe–30 % Ni alloy, using secondary ion mass spectrometry equipped with a Ga focused ion beam
| Autor: | Kazuto Kawakami, Tanaka Tomohito, Shun-ichi Hayashi |
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| Rok vydání: | 2013 |
| Předmět: |
Austenite
Materials science Hydrogen Mechanical Engineering Alloy Analytical chemistry chemistry.chemical_element engineering.material Focused ion beam Ion Secondary ion mass spectrometry chemistry Deuterium Mechanics of Materials engineering Grain boundary diffusion coefficient General Materials Science |
| Zdroj: | Journal of Materials Science. 49:3928-3935 |
| ISSN: | 1573-4803 0022-2461 |
| DOI: | 10.1007/s10853-013-7956-7 |
| Popis: | Time of flight secondary ion mass spectrometry (TOF-SIMS) equipped with a high spatial resolution Ga focused ion beam (Ga-FIB) was applied to understand hydrogen diffusion and desorption behavior in duplex stainless steel and Fe–30 % Ni alloys. Deuterium was used as a tracer of hydrogen. Results showed that the secondary ion intensity from body-centered cubic (bcc) and face-centered cubic (fcc) Fe represents the flux of deuterium from the surface and the concentration of deuterium, respectively. The deuterium-depleted zone can be visualized from the interface between bcc and fcc phase to fcc Fe on the surface. Furthermore, direct visualization of the grain boundary diffusion of deuterium is also possible in fcc Fe–30 % Ni alloys, using Ga-FIB-TOF-SIMS. |
| Databáze: | OpenAIRE |
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