Effect of post-annealing for Cu2SnS3 thin films prepared by sulfurization process

Autor: M. Nakashima, Y. Hagiwara, T. Yamaguchi, J. Sasano, M. Izaki
Rok vydání: 2018
Předmět:
Zdroj: Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.
DOI: 10.7567/ssdm.2018.ps-6-08
Databáze: OpenAIRE