Precision Measurement and Comprehensive Analysis of Dielectrophoretic Crossover Behavior of Micro-Particles

Autor: Chia-Ling Hung, Ying-Chuan Kao, Jia-Yang Juang, Yun-Wei Lu, Chieh Sun
Rok vydání: 2019
Předmět:
Zdroj: ASME 2019 28th Conference on Information Storage and Processing Systems.
Popis: To be one of the hottest topics recent years, a huge amount of diverse applications of the Dielectrophoresis (DEP) phenomenon have been discovered and published. The DEP force mainly comes from the difference in dielectric polarizability between the suspended particles and the suspending medium and it only occurs when the applied AC electric field is non-uniform in space. There are many important parameters that affect the magnitude, direction and the crossover frequency of the DEP force, such as the applied AC electric field frequency, electric field distribution, applied voltage, medium conductivity, particle permittivity, particle size, the electric double layer of particles and so on. Variation of each of the above mentioned parameters could cause great difference in the dielectrophoretic behavior of particles. People have made great efforts in quantifying the influence of them but there are still a lot of uncertain relations and mechanisms to be verified. Therefore, we present a comprehensive analysis of the crossover behavior of micro-particles due to DEP and several concurrent phenomena through both experiments and finite element simulations and provides an important foundation for further insight into electrical properties of micro-particles and for more advanced Lab-on-chip devices developments.
Databáze: OpenAIRE