Correlation between emission and structural properties of poly(p-phenylene vinylene) thin films
| Autor: | H. de Santana, M.A.T. da Silva, Edson Laureto, Ricardo Vignoto Fernandes, Ivan Frederico Lupiano Dias, José Leonil Duarte |
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| Rok vydání: | 2013 |
| Předmět: |
chemistry.chemical_classification
Materials science Photoluminescence business.industry Mechanical Engineering Metals and Alloys Analytical chemistry Poly(p-phenylene vinylene) Polymer Conjugated system Condensed Matter Physics Electronic Optical and Magnetic Materials Absorbance symbols.namesake chemistry.chemical_compound chemistry Mechanics of Materials Materials Chemistry symbols Optoelectronics Deposition (phase transition) Thin film business Raman scattering |
| Zdroj: | Synthetic Metals. 170:25-30 |
| ISSN: | 0379-6779 |
| DOI: | 10.1016/j.synthmet.2013.03.003 |
| Popis: | In this work we used different methods and parameters of deposition in order to obtain thin films of poly(p-phenylene vinylene) (PPV) with different structural properties. These properties were characterized by measurements of absorbance, Raman scattering, and photoluminescence (PL) as a function of temperature. The analysis of experimental data allowed us to observe the dependence of optical spectra with the effective conjugation length and the interaction between the polymer chains. In particular, we were able to correlate the dependence of the PL line shape with temperature and the values of emission anisotropy factor of the films with the intra and interchains energy migration processes. These results led us to conclude that such processes are essential ingredients for a proper analysis of the optical response of thin films of conjugated polymers. |
| Databáze: | OpenAIRE |
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