Compendium of Single Event Effects Test Results for Selected Integrated Circuits

Autor:	Steven C. Witczak, Jeremiah J. Horner, James S. Hack, Norman P. Goldstein, Paul V. Dudek, Brainton U. Song, Scott R. Messenger, Glen E. Macejik, Thomas J. Knight
Rok vydání:	2020
Zdroj:	2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
DOI:	10.1109/radecs50773.2020.9857696
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6a08a2a456edf96d56da909595459a59 https://doi.org/10.1109/radecs50773.2020.9857696 Zobrazit plný text záznamu