Parametric composite limited yield index for functional circuits yield prediction

Autor:	George E. Rudgers, Jiun-Hsin Liao, Fred J. Towler, R. Logan, Ishtiaq Ahsan
Rok vydání:	2011
Předmět:	Engineering Yield (engineering) Index (economics) business.industry Logic gate Composite number Hardware_INTEGRATEDCIRCUITS Electronic engineering Condition monitoring business Test data Electronic circuit Parametric statistics
Zdroj:	2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.
DOI:	10.1109/asmc.2011.5898160
Popis:	In this paper we present an early detection mechanism for semiconductor circuit yield prediction and tracking. Several discrete devices used as components of functional circuits have been examined by their first-metal level test data and correlated to the higher metal level functional yield. A concept of Device Health Composite Yield is also introduced in this paper.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6a04237035535353c6b9e0dc020b5ce3 https://doi.org/10.1109/asmc.2011.5898160 Zobrazit plný text záznamu