Anomaly detection and analysis by a gradient boosting trees and neural network ensemble model

Autor: Tanaka Hisanori, Takayuki Nishimura
Rok vydání: 2020
Předmět:
Zdroj: 2020 International Symposium on Semiconductor Manufacturing (ISSM).
DOI: 10.1109/issm51728.2020.9377494
Popis: In this paper, we describe a method for predicting product characteristics, its evaluation results, and application examples. Process equipment data is selected as an explanatory variable. By using an ensemble of gradient boosting trees and neural networks, we were able to construct a prediction model with higher accuracy than the conventional model. In addition, anomaly detection and analysis based on this prediction model are discussed.
Databáze: OpenAIRE