Trench-Structured High-Current-Driving Aluminum-Doped Indium–Tin–Zinc Oxide Semiconductor Thin-Film Transistor

Autor: Do Hyung Kim, Kwang-Heum Lee, Seung Hee Lee, Junsung Kim, Junghoon Yang, Jingyu Kim, Seong-In Cho, Kwang Hwan Ji, Chi-Sun Hwang, Sang-Hee Ko Park
Rok vydání: 2022
Předmět:
Zdroj: IEEE Electron Device Letters. 43:1677-1680
ISSN: 1558-0563
0741-3106
DOI: 10.1109/led.2022.3201072
Databáze: OpenAIRE