XPS and AFM characterisation of selective monolayers for cationic detection: application to field effect chemical micro-sensors

Autor:	René Berjoan, Patrick Seta, S. Rochefeuille, Jean-Pierre Desfours, C. Jimenez
Rok vydání:	2003
Předmět:	Atomic force microscopy business.industry Chemistry Cationic polymerization Analytical chemistry General Physics and Astronomy Field effect Spectral line Semiconductor X-ray photoelectron spectroscopy Monolayer Field-effect transistor Physical and Theoretical Chemistry business
Zdroj:	Chemical Physics Letters. 376:274-281
ISSN:	0009-2614
DOI:	10.1016/s0009-2614(03)00978-3
Popis:	X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) have been used to investigate physico-chemical properties of mixed Langmuir-films made of carboxylic ionophores and phospholipids. The selective monolayers were deposited onto semiconductor structures. Differences found in various experiments of friction force corresponded well with those found from XPS spectra. The cation detection by the monolayer was also proved by XPS studies and confirmed by significative sensitivities found with functionalised ion-sensitive field effect transistors (ISFETs).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::691bbcafe753eeead56e2f35b04397de https://doi.org/10.1016/s0009-2614(03)00978-3 Zobrazit plný text záznamu Full Text from ScienceDirect