A Differential Probe with Integrated Balun for On-wafer Measurements in the WR-3.4 (220 – 330 GHz) Waveguide Band
| Autor: | Matthew F. Bauwens, Linli Xie, Michael E. Cyberey, Chunhu Zhang, Arthur W. Lichtenberger, Robert M. Weikle, N. Scott Barker |
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| Rok vydání: | 2019 |
| Předmět: |
Waveguide (electromagnetism)
Materials science Fabrication business.industry 020206 networking & telecommunications 02 engineering and technology Test probe Signal Transmission line Balun 0202 electrical engineering electronic engineering information engineering Scattering parameters Optoelectronics Wafer business |
| Zdroj: | 2019 IEEE MTT-S International Microwave Symposium (IMS). |
| DOI: | 10.1109/mwsym.2019.8701058 |
| Popis: | This paper demonstrates the first differential on-wafer probe with integrated balun operating in the WR-3.4 (220 – 330 GHz) waveguide band. The probe employs integrated balun circuitry to convert the single-ended signal from the waveguide output of a VNA into differential stimuli at the on-wafer transmission line output. The design approach, fabrication method, and measured results are described in this paper. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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