Densities and Surface Reaction Probabilities of Oxygen and Nitrogen Atoms During Sputter Deposition of ZnInON on ZnO

Autor: Keigo Takeda, Tomoaki Ide, Kazunori Koga, Daisuke Yamashita, Naho Itagaki, Hyunwoong Seo, Koichi Matsushima, Masaru Hori, Masaharu Shiratani
Rok vydání: 2017
Předmět:
Zdroj: IEEE Transactions on Plasma Science. 45:323-327
ISSN: 1939-9375
0093-3813
DOI: 10.1109/tps.2016.2632124
Popis: We report densities and surface reaction probabilities of O and N atoms during sputter deposition of ZnInON films on ZnO templates, measured via vacuum ultraviolet absorption spectroscopy. O density is almost constant of $4.5 \times 10^{11}$ cm−3 irrespective of O2 gas flow rate, whereas N density increases sharply from $2.7 \times 10^{11}$ cm−3 for O2 gas sccm to $7.7 \times 10^{11}$ cm−3 for 0.6 sccm and it increases gradually $10^{11}$ cm−3 for 5 sccm. The surface reaction probability $\beta _{O}$ of O atoms on ZnInON increases significantly from 0.022 to 0.404 with increasing O2 gas flow rate from 0 to 5 sccm, whereas $\beta _{N}$ of N atoms on ZnInON decreases slightly from 0.018 to 0.006. The stoichiometric chemical compositional ratio of ZnInON films with [Zn]/([Zn] + [In]) = [O]/([O] + [N]) = 94% is obtained at $\beta _{O}=0.404$ of O atoms. This stoichiometric compositional ZnInON films grow coherently on ZnO templates, while nonstoichiometric films do not. The stoichiometric chemical composition is the key to coherent growth of ZnInON films.
Databáze: OpenAIRE