Fast and Ultrafast Energy-Dispersive X-Ray Reflectrometry Based on Prism Optics
| Autor: | S. S. Gizha, O. V. Konovalov, A. G. Tur’yanskii |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Materials science Physics and Astronomy (miscellaneous) Absorption spectroscopy Scattering business.industry Physics::Optics 02 engineering and technology 021001 nanoscience & nanotechnology Laser 01 natural sciences Synchrotron Charged particle law.invention Optics law 0103 physical sciences Prism Thin film 0210 nano-technology business Ultrashort pulse |
| Zdroj: | JETP Letters. 106:828-832 |
| ISSN: | 1090-6487 0021-3640 |
| Popis: | Interference spectra of X-ray reflection from thin films have been obtained for the first time by the decomposition of the spectrum of a polychromatic beam by means of a diamond prism. The measurements of film nanostructures and reference absorption spectra have been performed at the ESRF synchrotron. The proposed spectrometric scheme allows obtaining the interference pattern in a wide range of the scattering vector length q without angular scanning. This makes it possible to study ultrafast processes in layered nanostructures at an intense external action of laser pulses or charged particles with a time resolution of about the duration of an X-ray pulse. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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