The impact of ASIC devices on the SEU vulnerability of space-borne computers
| Autor: | R. Koga, W.R. Crain, S.J. Hansel, K.B. Crawford, S.D. Pinkerton, T.K. Tsubota |
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| Rok vydání: | 1992 |
| Předmět: |
Nuclear and High Energy Physics
Engineering business.industry Electrical engineering Hardware_PERFORMANCEANDRELIABILITY Integrated circuit Circuit reliability law.invention Nuclear Energy and Engineering Application-specific integrated circuit CMOS law Single event upset Electronic engineering Microelectronics Electronics Electrical and Electronic Engineering Field-programmable gate array business |
| Zdroj: | IEEE Transactions on Nuclear Science. 39:1685-1692 |
| ISSN: | 1558-1578 0018-9499 |
| Popis: | Application-specific integrated circuits (ASICs) offer a number of advantages over traditional multicomponent microcircuits, including reductions in both size and power dissipation, and are therefore prime candidates to replace such microcircuits in space borne electronics systems. The results of recent tests of the susceptibilities of various ASIC devices to cosmic ray and trapped proton induced single event upset (SEU) and latchup are reported and are compared to the susceptibilities of the devices that they would replace. This comparison leads to a discussion of the impact of ASIC devices on the SEU susceptibility of spaceborne computers. > |
| Databáze: | OpenAIRE |
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