Impact of Single Defects on NBTI and PBTI Recovery in SiO2 Transistors

Autor:	K. Tselios, T. Knobloch, J. Michl, D. Waldhoer, C. Schleich, E. Ioannidis, H. Enichlmair, R. Minixhofer, T. Grasser, M. Waltl
Rok vydání:	2022
Zdroj:	2022 IEEE International Integrated Reliability Workshop (IIRW).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::68630d33acce544c3846d149583b75ca https://doi.org/10.1109/iirw56459.2022.10032748 Zobrazit plný text záznamu