An Economic Reliability Test Plans for Exponential Pareto Distribution

Autor:	D.C.U. Sivakumar, K. Kalyani, N. Sivaramakrishna, K. Rosaiah
Rok vydání:	2018
Předmět:	symbols.namesake Computer science symbols Pareto distribution Test plan Reliability (statistics) Exponential function Reliability engineering
Zdroj:	Journal of Computer and Mathematical Sciences. 9:1851-1860
ISSN:	0976-5727
DOI:	10.29055/jcms/931
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::686099693e196214e5aca9e5f76818ca https://doi.org/10.29055/jcms/931 Zobrazit plný text záznamu