Autor: |
Ching-hsi Lin, Laurence P. Sadwick, R. J. Hwu |
Rok vydání: |
2003 |
Předmět: |
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Zdroj: |
Journal of Crystal Growth. 247:77-83 |
ISSN: |
0022-0248 |
Popis: |
Microtwins in semi-metal thulium phosphide (TmP) epilayers grown on (0 0 1) GaAs substrates by molecular beam epitaxy have been studied by transmission electron microscopy. Selected area diffraction patterns show extra spots along 〈1 1 1〉 and 〈2 2 4〉 corresponding to three times the normal rock-salt periodicity. Only one or two twin variants are found in the crystal. The occurrence of the observed microtwins in the TmP-GaAs heterostructure can be accounted for by the growth-accident mechanism, i.e., the formation of microtwins is via growth accidents in the stacking sequence on {1 1 1} and {1 1 2} planes. The growth accidents appear to occur due to rapid growth rates and/or contamination. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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