| Autor: |
M. Kasprzak, Zoltán Balogh, Gerd Hendrik Greiwe, Mohammed Reda Chellali, Ralf Schlesiger, Christian Oberdorfer, Patrick Stender, Guido Schmitz, Dietmar Baither |
| Rok vydání: |
2012 |
| Předmět: |
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| Zdroj: |
Defect and Diffusion Forum. :3-10 |
| ISSN: |
1662-9507 |
| DOI: |
10.4028/www.scientific.net/ddf.323-325.3 |
| Popis: |
Nanoscale systems show a wide variety of physical properties that cannot be observed in the bulk. Using atom probe tomography, it is possible to study nanostructured materials with almost atomic resolution in all three dimensions. In this article, we will present a short review of the latest atom-probe measurements carried out at University of Münster with particular focus on diffusion and segregation measurements in triple junctions and interface analysis. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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