Measuring Deep Metastability and Its Effect on Synchronizer Performance

Autor:	D.J. Kinniment, C.E. Dike, K. Heron, G. Russell, A.V. Yakovlev
Rok vydání:	2007
Předmět:	Reliability (semiconductor) Synchronizer Hardware and Architecture Computer science Metastability Electronic engineering System on a chip Electrical and Electronic Engineering Circuit reliability Software Synchronization
Zdroj:	IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 15:1028-1039
ISSN:	1063-8210
DOI:	10.1109/tvlsi.2007.902207
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6809a08b5c02cd5597d26d8d1a137d56 https://doi.org/10.1109/tvlsi.2007.902207 Zobrazit plný text záznamu