Modeling Approaches for Rapid Thermal Chemical Vapor Deposition

Autor: Klavs F. Jensen, P. Futerko, Theodoros G. Mihopoulos, M. Hierlemann, H. Simka
Rok vydání: 1996
Předmět:
Zdroj: Advances in Rapid Thermal and Integrated Processing ISBN: 9789048146963
Popis: Chemical vapor deposition (CVD) performed in rapid thermal processing (RTP) chambers, also referred to as rapid thermal chemical vapor deposition (RTCVD), has been demonstrated for a wide range of typical microelectronics manufacturing processes [1], including growth of silicon [2], silicon oxide [3], and silicon nitride [4], as well as new processes, such as the growth of silicon germanium alloys [5]. These CVD systems share common features of gas-phase and surface reactions combined with fluid flow, heat transfer, and chemical species transport (cf. Figure 1).
Databáze: OpenAIRE