A fault diagnosis method for photovoltaic arrays based on fault parameters identification
Autor: | Yuanliang Li, Jingwei Zhang, Chen Fudong, Kun Ding, Chen Xiang, Wu Jiabing |
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Rok vydání: | 2019 |
Předmět: |
Optimization problem
060102 archaeology Renewable Energy Sustainability and the Environment Computer science 020209 energy Reliability (computer networking) Photovoltaic system Photovoltaic arrays Hardware_PERFORMANCEANDRELIABILITY 06 humanities and the arts 02 engineering and technology Fault (power engineering) Identification (information) Control theory Differential evolution 0202 electrical engineering electronic engineering information engineering 0601 history and archaeology State (computer science) |
Zdroj: | Renewable Energy. 143:52-63 |
ISSN: | 0960-1481 |
DOI: | 10.1016/j.renene.2019.04.147 |
Popis: | Aiming at evaluating the state of the photovoltaic (PV) array and improving the reliability of the PV system, a fault diagnosis method for PV arrays based on fault parameters identification is proposed in this paper. Compared with existing fault diagnosis methods, the proposed method has advantages of recognizing concurrent faults and describing each fault quantitatively by identifying fault parameters from the measured current-voltage (I–V) curve of the PV array. The methodology consists of three parts. Firstly, functional relationships between unknown parameters in the one-diode model of PV cells with environmental parameters are obtained by parameters extraction. Secondly, a code-based fast fault simulation model (CFFSM) is established to simulate I–V curves of the PV array under various faulted conditions. Thirdly, by determining the fault parameters to be identified and constructing an objective function that is the error between the simulated I–V curve with the measured I–V curve, an optimization problem is formulated, in which optimal fault parameters are identified by applying the differential evolution (DE) algorithm. The validation experiments in summer and early spring show that the proposed diagnosis method can identify the parameters of up to three concurrent faults, including partial shading, short circuit, and increased series-resistance losses, under good irradiance condition with high accuracy. |
Databáze: | OpenAIRE |
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