Accuracy and precision of position determination in ISTEM imaging of BaTiO3
Autor: | Tim Grieb, Dennis Marquardt, Andreas Rosenauer, Christoph Mahr, Thorsten Mehrtens, Florian F. Krause, Marco Schowalter |
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Rok vydání: | 2021 |
Předmět: |
010302 applied physics
Accuracy and precision Microscope Materials science business.industry Shot noise 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention Lens (optics) Spherical aberration Optics law Beam tilt 0103 physical sciences Scanning transmission electron microscopy Figure of merit 0210 nano-technology business Instrumentation |
Zdroj: | Ultramicroscopy. 227:113325 |
ISSN: | 0304-3991 |
Popis: | In this paper we study the effect of lens aberrations (spherical aberration and astigmatism), beam tilt, contamination and shot noise on the accuracy and precision of position determination in imaging scanning transmission electron microscopy (ISTEM) on the example of BaTiO 3 . ISTEM images are simulated as a function of sample thickness and defocus starting from a nearly perfect microscope setting. A defocus range was identified, in which atom column positions were reliably visible and could be decently measured. By averaging over this defocus and thickness range a figure of merit was defined and used to study the influence of above mentioned disturbing effects as a function of their strength. It turned out that column positions might become inaccurate, but distances are measured accurately. These were used to obtain recommendations for the experimental setup to measure the atomic arrangement that induces ferroelectric switching of BaTiO 3 . |
Databáze: | OpenAIRE |
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