Organic photovoltaic annealing process analysis using impedance spectroscopy
| Autor: | Xizu Wang, Jie Zhang, Bin Liu, Lin Ke, Zhi Ming Kam, Rong Wang, Edna Low, Nan Zhang |
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| Rok vydání: | 2017 |
| Předmět: |
Fabrication
Materials science Organic solar cell Renewable Energy Sustainability and the Environment Annealing (metallurgy) business.industry 02 engineering and technology Carrier lifetime 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences Cathode 0104 chemical sciences Dielectric spectroscopy law.invention law Equivalent circuit Optoelectronics General Materials Science 0210 nano-technology business Electrical impedance |
| Zdroj: | Solar Energy. 144:367-375 |
| ISSN: | 0038-092X |
| DOI: | 10.1016/j.solener.2017.01.044 |
| Popis: | Organic solar cells based on P3HT:PCBM without annealing process, with annealing process before and after cathode deposition have been investigated in dark and under light by using high magnitude and phase resolution impedance spectrometer. The impedance data in dark can be interpreted as the properties and positions of layers and interfaces of the sample to nanoscale range. Therefore, the fabrication process and device nanoscale layer and interface quality can be monitored. Under light conditions, the impedance data obtained were fitted into equivalent circuit and electronic parameters such as diffusion time of electrons, τd and effective carrier lifetime, τn were calculated. Correlation of the nanoscale layers and interface parameters to the dynamic carrier performance parameters were established. Applying the high magnitude and phase resolution impedance method to understand the properties of organic thin-film solar cells in both static and dynamic status will give useful insights not only on the device performance improvement in terms of process, layer morphology and interfaces quality; but also deeper understanding of how the device kinetic characteristics at the interface states induced correlate with the improvement of current-potential characteristics under device operation conditions. |
| Databáze: | OpenAIRE |
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