Growth dynamics and cell migration in ferroelectric thin films

Autor:	Zhang Ying, Jin Long Li, Xianhua Wei, Yanrong Li, Hui Zhong Zeng, Jin Long Tang, Zhu Jun
Rok vydání:	2006
Předmět:	Surface diffusion Self-diffusion Materials science Physics and Astronomy (miscellaneous) Oxide Activation energy Epitaxy Ferroelectricity Crystallography chemistry.chemical_compound chemistry Electron diffraction Chemical physics Thin film
Zdroj:	Applied Physics Letters. 88:152901
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.2171478
Popis:	Growth dynamics and unit cell migration of ferroelectric (Ba,Sr)TiO3 thin films were systematically studied with in situ reflective high-energy electron diffraction and atom force microscopy. By measuring the amplitudes of slow surface recovery oscillations of SrTiO3 film grown on (001) SrTiO3 surface, the activation energy of unit cell surface self-diffusion was surprisingly found to be only 0.29±0.01eV. A “unit-cell migration” model was developed to understand the epitaxial growth dynamics of ferroelectric thin films, which is a critical issue in oxide thin film growth and crucial in controlling the atomic structures.
Databáze:	OpenAIRE
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