Dosimetry of Thermal Neutron Beamlines at a Pulsed Spallation Source for Application to the Irradiation of Microelectronics
| Autor: | Christopher D. Frost, G. Jeff Sykora, Carlo Cazzaniga, D. Raspino |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
Nuclear and High Energy Physics
Materials science Physics::Instrumentation and Detectors 010308 nuclear & particles physics business.industry 01 natural sciences Neutron temperature Optics Nuclear Energy and Engineering Beamline 0103 physical sciences Gas electron multiplier Neutron source Microelectronics Spallation Neutron Electrical and Electronic Engineering business ISIS neutron source |
| Zdroj: | IEEE Transactions on Nuclear Science. 68:921-927 |
| ISSN: | 1558-1578 0018-9499 |
| Popis: | Gas electron multiplier (GEM) detectors and activation foils have been used for dosimetry of thermal beamlines of a pulsed neutron source. The first is an active detector that performs measurements using the time-of-flight technique, taking advantage of the pulsed nature of the source. The same detector has been used successfully to measure the profiles of the beams. The second is a passive irradiation method that independently confirms the measured fluxes of equipment materials and mechanics analyzer (EMMA) and rotating analyzer crystal (X) spectrometer (ROTAX) beamlines of the ISIS neutron source. They feature different thermal spectra, the first being moderated with water (300 K) and the second with liquid methane (100 K). These two characterized beamlines have been used for the irradiation of microelectronics for single-event effect testing using a reference static random access memory (SRAM) module. It is shown that results are consistent and that a correction factor must be applied to scale the results on the cold beamline to the one at room temperature. |
| Databáze: | OpenAIRE |
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