Proton Damage in Micropac 66183-300 Optocoupler

Autor:	Farokh Irom, Gregory R. Allen, Larry D. Edmonds, Bernard G. Rax
Rok vydání:	2018
Předmět:	Materials science Proton 010308 nuclear & particles physics business.industry Transistor 01 natural sciences law.invention law Transfer ratio 0103 physical sciences Degradation (geology) Optoelectronics Neutron Statistical analysis Current (fluid) business Light-emitting diode
Zdroj:	2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
DOI:	10.1109/radecs45761.2018.9328715
Popis:	This paper reports proton damage in the Micropac 66183–300 optocoupler and investigates the radiation degradation of the optocoupler current transfer ratio (CTR) and transistor gain, HFE. We present statistical analysis using a one-sided tolerance method on the optocoupler CTR data.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::66e6e6a510deb7aae5be9eabc835a882 https://doi.org/10.1109/radecs45761.2018.9328715 Zobrazit plný text záznamu