Switching loss of 600 V Gen-1 and Gen-2 P-MCTs in soft-switching circuits

Autor:	V. Temple, Stephen Daley Arthur, Eric X Yang
Rok vydání:	2002
Předmět:	Engineering Soft switching business.industry Conduction loss Circuit design Electronic engineering Electrical engineering Thyristor Dissipation business Power (physics) Electronic circuit Diode
Zdroj:	Proceedings of 1995 IEEE Applied Power Electronics Conference and Exposition - APEC'95.
DOI:	10.1109/apec.1995.469104
Popis:	This paper characterizes switching losses of 600 V generation-1 and generation-2 P-MCT (MOS controlled thyristors) devices. These devices, packaged in TO-218 and TO-247, are rated at 75 A for continuous current at 90/spl deg/C case temperature. By operating the MCTs in soft switching fashion, the turn-on and the turn-off losses can be greatly reduced or eliminated. In such circuits dissipation in the MCTs is dominated by conduction loss which is low and close to power diodes with the similar ratings. To assist practical circuit design, this paper presents test results for several possible soft switching operations of the MCTs. The surge current capability of the MCTs is also demonstrated. >
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::66e6010e4d48966afd9e0312e4aec78f https://doi.org/10.1109/apec.1995.469104 Zobrazit plný text záznamu