Popis: |
The techniques of ion implantation and Rutherford backscattering analysis were used to determine the transport numbers of metal and oxygen during the anodic oxidation of vanadium. These were found to be 0.28 +- 0.05 and 0.72 +- 0.05, respectively. The Rutherford backscattering analysis simultaneously gives the ratio of V/O in the film. This was found to be 0.4 +- 0.02 thus indicating that the films are V/sub 2/O/sub 5/. The result was confirmed by use of the nuclear reaction /sup 16/O(d,p)/sup 17/O. (auth) |