Photoionization mass spectrometry of silane

Autor: Thomas Heinis, Kurt Börlin, Martin Jungen
Rok vydání: 1986
Předmět:
Zdroj: Chemical Physics. 103:93-100
ISSN: 0301-0104
Popis: The photoionization cross sections for the fragments of SiH 4 have been recorded between 11 and 20 eV. From the observed appearance energies we obtain Δ H 0 f (SiH + 2 ) ⩽ 1100 ± 5 kJ/mol, Δ H 0 f (SiH + 3 ⩽ 984 ± 5 kJ/mol and D 0 0 (H 2 Si + −H) = 3.46 eV. No SiH + 4 could be observed. Autoionization structure due to excited states of SiH 4 has been detected between 14 and 18 eV in all fragmentation channels. We have carried out ab initio calculations in order to clarify the nature of these states.
Databáze: OpenAIRE