Strengthened, biaxially textured Ni substrate with small alloying additions for coated conductor applications
| Autor: | B.Y Kang, Dominic F. Lee, Patrick M Martin, F.A. List, Mariappan Parans Paranthaman, M. M. Kowalewski, Edgar Lara-Curzio, James R. Thompson, Srivatsan Sathyamurthy, Claudia Cantoni, R. E. Ericson, Eliot D. Specht, Ron Feenstra, C. O. Stevens, D. M. Kroeger, Robert K. Williams, Amit Goyal, Tolga Aytug |
|---|---|
| Rok vydání: | 2002 |
| Předmět: |
Fabrication
Materials science Misorientation Oxide Energy Engineering and Power Technology Substrate (electronics) Condensed Matter Physics Electronic Optical and Magnetic Materials chemistry.chemical_compound chemistry Surface modification Grain boundary Texture (crystalline) Electrical and Electronic Engineering Composite material Yttria-stabilized zirconia |
| Zdroj: | Physica C: Superconductivity. 382:251-262 |
| ISSN: | 0921-4534 |
| DOI: | 10.1016/s0921-4534(02)00626-3 |
| Popis: | Fabrication of a biaxially textured, strengthened Ni substrate with small alloying additions of W and Fe is reported. The substrates have significantly improved mechanical properties compared to 99.99% Ni and surface characteristics which are similar to that of 99.99% Ni substrates. High quality oxide buffer layers can be deposited on these substrates without the need for any additional surface modification steps. Grain boundary misorientation distributions obtained from the substrate show a predominant fraction of low-angle grain boundaries. A high critical current density, J c , of 1.9 MA/cm 2 at 77 K, self-field is demonstrated on this substrate using a multilayer configuration of YBCO/CeO 2 /YSZ/Y 2 O 3 / Ni–3at.%W–1.7at.%Fe. This translates to a I c /width of 59 A/cm at 77 K and self-field. J c at 0.5 T is reduced by only 21% indicating strongly-linked grain boundaries in the YBCO film on this substrate. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect