Characterization of Uniformity in Nb/NbxSi1-x/Nb Josephson Junctions
| Autor: | Matthew R. Pufall, William H. Rippard, Samuel P. Benz, Eric R. J. Edwards, Michael L. Schneider, Ian W. Haygood, Anna E. Fox, Paul D. Dresselhaus |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
Superconductivity
Josephson effect Materials science business.industry System of measurement Conductivity Condensed Matter Physics 01 natural sciences Temperature measurement Die (integrated circuit) Electronic Optical and Magnetic Materials 0103 physical sciences Electrode Optoelectronics Electrical and Electronic Engineering 010306 general physics business Electronic circuit |
| Zdroj: | IEEE Transactions on Applied Superconductivity. 29:1-5 |
| ISSN: | 2378-7074 1051-8223 |
| DOI: | 10.1109/tasc.2019.2922225 |
| Popis: | The uniformity of the barriers in Josephson junctions (JJs) is a critical parameter in determining performance and operating margins for a wide variety of superconducting electronic circuits. We present an automated measurement system capable of measuring individual JJs across a 1 × 1 cm die at both ambient temperature and 4 K. This technique allows visualization of the spatial variation over a large area of the critical electrical properties of the junctions and allows for the direct correlation between room-temperature (RT) resistance and low temperature properties. The critical current variation of NbxSi1-x (x = 15%) barriers is found to be about 2.6% (one standard deviation) for 1024 junctions across an individual die and only weakly correlates with RT resistance measurements. |
| Databáze: | OpenAIRE |
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