Microstructural Investigation of the Thermally Grown Oxide on Grain-Refined Overdoped NiAl–Zr
| Autor: | Rachel White, Mark L. Weaver |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
010302 applied physics
Equiaxed crystals Nial Materials science 020209 energy Whiskers Alloy Metals and Alloys Oxide 02 engineering and technology Sputter deposition engineering.material 01 natural sciences Grain size Inorganic Chemistry chemistry.chemical_compound chemistry Transmission electron microscopy 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Materials Chemistry engineering Composite material computer computer.programming_language |
| Zdroj: | Oxidation of Metals. 92:227-242 |
| ISSN: | 1573-4889 0030-770X |
| DOI: | 10.1007/s11085-019-09920-2 |
| Popis: | The thermally grown oxide on sputter-deposited NiAl–0.09Zr was studied using transmission electron microscopy (TEM) and transmission Kikuchi diffraction (TKD) to microstructurally assess its oxidation resistance. Sputter deposition resulted in a refined grain size of 0.3 μm that was compared to extruded NiAl–Zr with a grain size of approximately 25 μm. Thermogravimetric oxidation of the sputter-deposited material showed a shorter transient regime with lower mass gain than an extruded NiAl–0.1Zr alloy and improved spallation resistance through 50 h of isothermal oxidation at 1000 °C. After 5 h the thermally grown oxide on the sputter-deposited alloy exhibited a three-layer structure consisting of external θ-Al2O3 whiskers, intermediate equiaxed α-Al2O3 grains ( |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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