A Test Architecture for Machine Learning Product

Autor: Hideto Ogawa, Yasuharu Nishi, Satoshi Masuda, Keiji Uetsuki
Rok vydání: 2018
Předmět:
Zdroj: ICST Workshops
DOI: 10.1109/icstw.2018.00060
Popis: As machine learning (ML) technology continues to spread by rapid evolution, the system or service using Machine Learning technology, called ML product, makes big impact on our life, society and economy. Meanwhile, Quality Assurance (QA) for ML product is quite more difficult than hardware, non-ML software and service because performance of ML technology is much better than non-ML technology in exchange for the characteristics of ML product, e.g. low explainability. We must keep rapid evolution and reduce quality risk of ML product simultaneously. In this paper, we show a Quality Assurance Framework for Machine Learning product. Scope of QA in this paper is limited to product evaluation. First, a policy of QA for ML Product is proposed. General principles of product evaluation is introduced and applied to ML product evaluation as a part of the policy. They are composed of A-ARAI: Allowability, Achievability, Robustness, Avoidability and Improvability. A strategy of ML Product Evaluation is constructed as another part of the policy. Quality Integrity Level for ML product is also modelled. Second, we propose a test architecture of ML product testing. It consists of test levels and fundamental test types of ML product testing, including snapshot testing, learning testing and confrontation testing. Finally, we defines QA activity levels for ML product.
Databáze: OpenAIRE