Atomic Force Microscopy Based Electric Modes in Characterization of Organic Photovoltaics
| Autor: | Sergey Belikov, Craig Wall, Sergei Magonov, John Alexander |
|---|---|
| Rok vydání: | 2013 |
| Předmět: |
Kelvin probe force microscope
Materials science business.industry Microscopy Scanning ion-conductance microscopy Optoelectronics Scanning gate microscopy Nanotechnology Scanning capacitance microscopy Conductive atomic force microscopy business Photoconductive atomic force microscopy Vibrational analysis with scanning probe microscopy |
| Zdroj: | MRS Proceedings. 1500 |
| ISSN: | 1946-4274 0272-9172 |
| DOI: | 10.1557/opl.2013.87 |
| Popis: | Capabilities of Atomic Force Microscopy in different modes including Electric Force Microscopy and Kelvin Force Microscopy are reviewed and illustrated on several samples including organic photovoltaics (P3HT/PCBM, PEDOT:PSS). Compositional mapping of these blends is enhanced with a combined use of the modes, and variations of local electric properties are detected down to the nanometer scale. The revealed morphology will assist in development of comprehensive models accounting for the structure-property relationship in solar cells and related devices. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full text from SpringerLink