Emission Source Microscopy Technique for EMI Source Localization
| Autor: | Pratik Maheshwari, Hamed Kajbaf, David Pommerenke, Victor Khilkevich |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Synthetic aperture radar
Engineering business.industry 020208 electrical & electronic engineering Complex system 020206 networking & telecommunications 02 engineering and technology Radiation Effective radiated power Condensed Matter Physics Atomic and Molecular Physics and Optics Electromagnetic interference Optics EMI Microscopy 0202 electrical engineering electronic engineering information engineering Electrical and Electronic Engineering business Image resolution |
| Zdroj: | IEEE Transactions on Electromagnetic Compatibility. 58:729-737 |
| ISSN: | 1558-187X 0018-9375 |
| DOI: | 10.1109/temc.2016.2524594 |
| Popis: | For large, complex systems with multiple sources at the same frequency, localizing the sources of radiation often proves difficult. This paper presents an emission source microscopy (ESM) technique derived from synthetic aperture radar (SAR) to localize radiating sources on a PCB. Near-field scanning provides limited information about the components contributing to far-field radiation. This paper presents the source localization methodology, supported by simulation and measurement results. After localizing the sources, the far-field contribution and the total radiated power from each individual source can be estimated. The results show that the proposed method can distinguish between multiple radiating sources on a complex PCB. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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