Scanning electron microscopy of reaction-sintered silicon nitride
| Autor: | Trevor F. Page, A. De S. Jayatilaka, J. A. Leake |
|---|---|
| Rok vydání: | 1974 |
| Předmět: |
Materials science
business.industry Scanning electron microscope Mechanical Engineering Scanning confocal electron microscopy Scanning gate microscopy Scanning capacitance microscopy chemistry.chemical_compound Silicon nitride chemistry Mechanics of Materials Solid mechanics Scanning ion-conductance microscopy Optoelectronics General Materials Science Electron beam-induced deposition business |
| Zdroj: | Journal of Materials Science. 9:514-515 |
| ISSN: | 1573-4803 0022-2461 |
| DOI: | 10.1007/bf00737860 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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