| Autor: |
Lee R. Dettmann, Anna Pierce, Erin M. Sabatke, Derek Sabatke |
| Rok vydání: |
2007 |
| Předmět: |
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| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.736305 |
| Popis: |
We developed a distortion measurement technique that works in snapshot mode. Distortion information across the full field of view can be captured in a single short exposure. To do this, a Ronchi ruling is placed in the object and image planes of the system under test. The undistorted ruling in the image plane interferes with the distorted image of the ruling, producing a Moire fringe pattern that can be analyzed in several ways. Phase shifting can be carried out by shifting the Ronchi ruling in object space. The technique is insensitive to vibration and turbulence. Measurements were routinely made with P-V noise levels of 1 μm on measured chief ray locations in 20 mm image planes (0.01%). Repeated measurements showed disagreements on the 6 μm level across a 20 mm image plane (0.03% repeatability). |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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